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Myeong, Ilho (명일호) – FeVNAND Research Summary (with pdf file)

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Myeong, Ilho (명일호) – FeVNAND Research Summary

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Yoo, Jinil (유진일) – Time Constant Analysis of Lateral Charge Loss in 3D NAND through Multiscale Simulations (with pdf file)

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Yoo, Jinil (유진일) – A New Semi-Analytical Model for Erase Transients of 3D GAA NAND Flash Memories (with pdf file)

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Oh, Eunseok (오은석) – Investigation of Random Telegraph Noise Scaling Dependency in 3D NAND Using Monte Carlo Simulator (with pdf file)

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Lee, Jangkyu (이장규) – Monte Carlo Simulator for Threshold Voltage Distribution of 3-D NAND Flash Memory Using Machine Learning (with pdf file)

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Kim, Juhyun (김주현) – Temperature Dependence Modeling of Grain Boundary Barrier Height in Macaroni MOSFETs (with pdf file)

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Kim, JuHyun (김주현) – Modeling of Grain Boundary Barrier Height for Macaroni MOSFETs with Un-doped Polycrystalline Silicon (with pdf file)

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Jo, Hyungjun (조형준) – Investigation of Endurance Characteristics in 3D NAND Flash Memory with Trap Profile Analysis (with pdf file)

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Jo, Hyungjun (조형준) – Compact Modeling of Trap-assisted Tunneling Current in 3-D NAND Flash Memory (with pdf file)

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