3D NAND Flash Related Journal/Conference Paper Briefing Seminar
♦ Integra provides summaries of journal and conference papers related to 3D NAND Flash memory, with online videos directly presented by the authors themselves.
♦ It will be helpful for researchers, engineers, and students on 3D NAND Flash memory device technology.
♦ Material: Journal or conference paper with the same title as the video.
커리큘럼
| Modeling of Grain Boundary Barrier Height for Macaroni MOSFETs with Un-doped Polycrystalline Silicon | |||
| Lecture – Juhyun Kim (김주현) (with pdf file) | 00:15:06 | ||
| An Innovative Program Scheme for Reducing Z-Interference in Charge-Trap-Based 3-D NAND Flash Memory | |||
| Lecture – Sangmin Ahn (안상민) (with pdf file) | 00:15:04 | ||
| Monte Carlo Simulator for Threshold Voltage Distribution of 3-D NAND Flash Memory Using Machine Learning | |||
| Lecture – Jangkyu Lee (이장규) (with pdf file) | 00:12:00 | ||
| A New Physical Model for Program Transients of Cylindrical Charge-Trap Based NAND Flash Memories | |||
| Lecture – Haechan Choi (최해찬) (with pdf file) | 00:14:54 | ||
| Time Constant Analysis of Lateral Charge Loss in 3D NAND through Multiscale Simulations | |||
| Lecture – Jinil Yoo (유진일) (with pdf file) | 00:15:04 | ||
| Investigation of Endurance Characteristics in 3D NAND Flash Memory with Trap Profile Analysis | |||
| Lecture – Hyungjun Jo (조형준) (with pdf file) | 00:14:15 | ||
| A New Semi-Analytical Model for Erase Transients of 3D GAA NAND Flash Memories | |||
| Lecture – Jinil Yoo (유진일) (with pdf file) | 00:15:04 | ||
| Machine Learning-Based Prediction of Threshold Voltage Distribution due to Lateral Migration in 3D NAND Flash Memory | |||
| Lecture – Insang Han (한인상) (with pdf file) | 00:15:42 | ||
| Compact Modeling of Trap-Assisted Tunneling Current in 3-D NAND Flash Memory | |||
| Lecture – Hyungjun Jo (조형준) (with pdf file) | 00:15:09 | ||
| Investigation of Random Telegraph Noise Scaling Dependency in 3D NAND Using Monte Carlo Simulator - Eunseok Oh (오은석) | |||
| Lecture – Eunseok Oh (오은석) (with pdf file) | 00:15:34 | ||
| Investigation of Cell Variation Effect on Z-Interference in Charge-Trap-Based 3-D NAND Flash Memory - Sangmin Ahn (안상민) | |||
| Lecture – Sangmin Ahn (안상민) (with pdf file) | 00:15:04 | ||
| Temperature Dependence Modeling of Grain Boundary Barrier Height in Macaroni MOSFETs - Juhyun Kim (김주현) | |||
| Lecture – Juhyun Kim (김주현) (with pdf file) | 00:15:25 | ||
| FeVNAND Research Summary | |||
| Lecture – Ilho Myeong (명일호) (with pdf file) | 00:15:34 | ||
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