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Modeling of Grain Boundary Barrier Height for Macaroni MOSFETs with Un-doped Polycrystalline Silicon, Juhyun Kim (with pdf file)
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Time Constant Analysis of Lateral Charge Loss in 3D NAND through Multiscale Simulations, Jinil Yoo (with pdf file)
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“Time Constant Analysis of Lateral Charge Loss in 3D NAND through Multiscale Simulations, Jinil Yoo (with pdf file)” has been added to your cart.
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Modeling of Grain Boundary Barrier Height for Macaroni MOSFETs with Un-doped Polycrystalline Silicon, Juhyun Kim (with pdf file)
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24,200
Modeling of Grain Boundary Barrier Height for Macaroni MOSFETs with Un-doped Polycrystalline Silicon, Juhyun Kim (with pdf file) quantity
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24,200
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Time Constant Analysis of Lateral Charge Loss in 3D NAND through Multiscale Simulations, Jinil Yoo (with pdf file)
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24,200
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24,200
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