• × Investigation of Endurance Characteristics in 3D NAND Flash Memory with Trap Profile Analysis, Hyungjin Jo (with pdf file) 2 × ₩22,000
• × Modeling of Grain Boundary Barrier Height for Macaroni MOSFETs with Un-doped Polycrystalline Silicon, Juhyun Kim (with pdf file) 2 × ₩24,200
• × A New Physical Model for Program Transients of Cylindrical Charge-Trap Based NAND Flash Memories, Haechan Choi 1 × ₩22,000
• × Time Constant Analysis of Lateral Charge Loss in 3D NAND through Multiscale Simulations, Jinil Yoo 2 × ₩22,000

Subtotal: ₩158,400

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