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Continue shopping “A New Physical Model for Program Transients of Cylindrical Charge-Trap Based NAND Flash Memories, Haechan Choi (with pdf file)” has been added to your cart.

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	Product	Price	Quantity	Total
×	Investigation of Endurance Characteristics in 3D NAND Flash Memory with Trap Profile Analysis, Hyungjin Jo	₩22,000	Investigation of Endurance Characteristics in 3D NAND Flash Memory with Trap Profile Analysis, Hyungjin Jo quantity	₩22,000
×	A New Physical Model for Program Transients of Cylindrical Charge-Trap Based NAND Flash Memories, Haechan Choi (with pdf file)	₩24,200	A New Physical Model for Program Transients of Cylindrical Charge-Trap Based NAND Flash Memories, Haechan Choi (with pdf file) quantity	₩24,200
×	Investigation of Cell Variation Effect on Z-Interference in Charge-Trap-Based 3-D NAND Flash Memory, Sangmin Ahn	₩22,000	Investigation of Cell Variation Effect on Z-Interference in Charge-Trap-Based 3-D NAND Flash Memory, Sangmin Ahn quantity	₩22,000
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